2D Triangulation Reflection Method
LJ Series

LJ Series

Shapes are directly measured by exposing the target to a line laser. Warpage is then measured using the measured waveform data. By moving the target while scanning it is also possible to make measurements of 3D shapes.

Point of selection

  • Possible to measure 2D height within a line
  • Unlimited target selection at ultra-high speeds
  • Ability to output waveform data
LJ-V Series
Ultra-High Speed In-line Profilometer
LJ-V Series